EMI Measurements: Methodology and Techniques

Published by Vladimir Kraz, OnFILTER, Inc. 3601-B Soquel, CA 95073 USA, Tel. +1-831-824-4052, Email: vkraz@onfilter.com Abstract This paper describes some aspects of methodology, instrumentation and techniques of measuring high-frequency electrical noise (EMI) in electronic manufacturing environment. High frequency measurements are quite different from typical ESD-related measurements which this paper explores. Introduction High-frequency noise (often, albeitContinue reading “EMI Measurements: Methodology and Techniques”

Evaluating Rapid Voltage Changes & its Propagation Effect using Multipoint Measurement Technique

Published by Muhammad Imam Sudrajat, University of Twente Enschede, The Netherlands, Indonesian Institute of Sciences, South Tangerang, Indonesia    m.i.sudrajat@utwente.nl Niek Moonen, University of Twente Enschede, The Netherlands niek.moonen@utwente.nl Hans Bergsma, Thales Nederland B.V. Hengelo, The Netherlands hans.bergsma@nl.thalesgroup.com Rob Bijman, Thales Nederland B.V. Hengelo, The Netherlands rob.bijman@nl.thalesgroup.com Frank Leferink, University of Twente Enschede, The NetherlandsContinue reading “Evaluating Rapid Voltage Changes & its Propagation Effect using Multipoint Measurement Technique”