Yearly Archives: 2021

Part 9 Markets and the Provision of Basic Service

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 9 Markets and the Provision of Basic Service”

Part 8 Standardizing Reliability and Power Quality Metrics

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 8 Standardizing Reliability and Power Quality Metrics”

Part 7 Valuing Reliability

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 7 Valuing Reliability”

Part 6 Pitfalls in Methods for Reliability Index Calculation

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 6 Pitfalls in Methods for Reliability Index Calculation”

Part 5 IEC Standards Description and Discussion

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 5 IEC Standards Description and Discussion”

Part 4 Loss of Load Probability: A Historical Perspective

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 4 Loss of Load Probability: A Historical Perspective”

Part 3 Power Quality: Definition and Discussion

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 3 Power Quality: Definition and Discussion”

Part 2 Reliability: Definition and Discussion

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 2 Reliability: Definition and Discussion”

Part 1: Introduction and Discussion of the Measurement “Toolkit”

Published by John D. Kueck and Brendan J. Kirby, Oak Ridge National Laboratory Philip N. Overholt, U.S. Department of Energy Lawrence C. Markel, Sentech, Inc. Published in Measurement Practices for Reliability and Power Quality: A Toolkit of Reliability Measurement Practices, 2004 Prepared by Oak Ridge National Laboratory Oak Ridge, Tennessee 37831-6285 managed by UT-BATTELLE, LLCContinue reading “Part 1: Introduction and Discussion of the Measurement “Toolkit””

EMI Measurements: Methodology and Techniques

Published by Vladimir Kraz, OnFILTER, Inc. 3601-B Soquel, CA 95073 USA, Tel. +1-831-824-4052, Email: vkraz@onfilter.com Abstract This paper describes some aspects of methodology, instrumentation and techniques of measuring high-frequency electrical noise (EMI) in electronic manufacturing environment. High frequency measurements are quite different from typical ESD-related measurements which this paper explores. Introduction High-frequency noise (often, albeitContinue reading “EMI Measurements: Methodology and Techniques”